Publicación:
CHARACTERIZATION OF AMORPHOUS PT/ZNO FILMS GROWN ON SILICON(100) SUBSTRATES BY A PHOTOCHEMICAL METAL ORGANIC DEPOSITION AND THEIR POTENTIAL USE AS GAS SENSORS

dc.creatorGERARDO ANDRÉS CABELLO GUZMÁN
dc.creatorLUIS ENRIQUE LILLO ARROYO
dc.date2013
dc.date.accessioned2025-01-10T14:33:41Z
dc.date.available2025-01-10T14:33:41Z
dc.date.issued2013
dc.description.abstractPURE AND 10% PT-LOADED ZINC OXIDE THIN FILMS HAVE BEEN SUCCESSFULLY PREPARED BY DIRECT UV IRRADIATION OF BIS(?-DIKETONATE)ZINC(II) AND PT(II) PRECURSOR COMPLEXES SPIN-COATED ON SI(1 0 0) SUBSTRATES. THE SURFACE MORPHOLOGY OF THE FILMS WAS CHARACTERIZED USING ATOMIC FORCE MICROSCOPY (AFM) AND IT SHOWED THAT THE AS-PHOTODEPOSITED FILMS ARE AMORPHOUS AND HAVE A ROUGHER SURFACE THAN THERMALLY TREATED FILMS. THE CHEMICAL COMPOSITION OF THE FILMS WAS DETERMINED BY X-RAY PHOTOELECTRON SPECTROSCOPY (XPS). THE RESULTS INDICATED THE PRESENCE OF ZNO AND PTO ON THE SURFACE OF AS-DEPOSITED LOADED ZINC OXIDE FILMS. GAS SENSING TESTS REVEAL THAT AS-DEPOSITED 10% PT/ZNO FILMS EXHIBIT A BETTER RESPONSE THAN PURE ZNO FILMS TOWARDS 20 PPM CARBON MONOXIDE AT AN OPERATING TEMPERATURE OF 250 °C. THE SENSORS ALSO HAVE FAST RESPONSE AND RECOVERY CHARACTERISTICS.
dc.formatapplication/pdf
dc.identifier.doi10.1016/j.poly.2013.06.028
dc.identifier.issn0277-5387
dc.identifier.urihttps://repositorio.ubiobio.cl/handle/123456789/7964
dc.languagespa
dc.publisherPOLYHEDRON
dc.relation.uri10.1016/j.poly.2013.06.028
dc.rightsPUBLICADA
dc.subjectZINC OXIDE
dc.subjectTHIN FILMS
dc.subjectPHOTOELECTRON SPECTROSCOPY
dc.subjectPHOTOCHEMICAL DEPOSITION
dc.subjectCARBON MONOXIDE SENSOR
dc.titleCHARACTERIZATION OF AMORPHOUS PT/ZNO FILMS GROWN ON SILICON(100) SUBSTRATES BY A PHOTOCHEMICAL METAL ORGANIC DEPOSITION AND THEIR POTENTIAL USE AS GAS SENSORS
dc.typeARTÍCULO
dspace.entity.typePublication
ubb.EstadoPUBLICADA
ubb.Otra ReparticionDEPARTAMENTO DE CIENCIAS BASICAS
ubb.Otra ReparticionDEPARTAMENTO DE CIENCIAS BASICAS
ubb.SedeCHILLÁN
ubb.SedeCHILLÁN
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