Publicación:
MELAMINE FACED PANELS DEFECT CLASSIFICATION BEYOND THE VISIBLE SPECTRUM.

Vista sencilla de ítem
dc.creatorCRISTHIAN ALEJANDRO AGUILERA CARRASCO
dc.date2018
dc.date.accessioned2025-01-10T15:03:19Z
dc.date.available2025-01-10T15:03:19Z
dc.date.issued2018
dc.description.abstractIN THIS WORK, WE EXPLORE THE USE OF IMAGES FROM DIFFERENT SPECTRAL BANDS TO CLASSIFY DEFECTS IN MELAMINE FACED PANELS, WHICH COULD APPEAR THROUGH THE PRODUCTION PROCESS. THROUGH EXPERIMENTAL EVALUATION, WE EVALUATE THE USE OF IMAGES FROM THE VISIBLE (VS), NEAR-INFRARED (NIR), AND LONG WAVELENGTH INFRARED (LWIR), TO CLASSIFY THE DEFECTS USING A FEATURE DESCRIPTOR LEARNING APPROACH TOGETHER WITH A SUPPORT VECTOR MACHINE CLASSIFIER. TWO DESCRIPTORS WERE EVALUATED, EXTENDED LOCAL BINARY PATTERNS (E-LBP) AND SURF USING A BAG OF WORDS (BOW) REPRESENTATION. THE EVALUATION WAS CARRIED ON WITH AN IMAGE SET OBTAINED DURING THIS WORK, WHICH CONTAINED FIVE DIFFERENT DEFECT CATEGORIES THAT CURRENTLY OCCURS IN THE INDUSTRY. RESULTS SHOW THAT USING IMAGES FROM BEYOND THE VISUAL SPECTRUM HELPS TO IMPROVE CLASSIFICATION PERFORMANCE IN CONTRAST WITH A SINGLE VISIBLE SPECTRUM SOLUTION.
dc.formatapplication/pdf
dc.identifier.doi10.3390/s18113644
dc.identifier.issn1424-8220
dc.identifier.issn1424-8220
dc.identifier.urihttps://repositorio.ubiobio.cl/handle/123456789/10200
dc.languagespa
dc.publisherSENSORS
dc.relation.uri10.3390/s18113644
dc.rightsPUBLICADA
dc.titleMELAMINE FACED PANELS DEFECT CLASSIFICATION BEYOND THE VISIBLE SPECTRUM.
dc.typeARTÍCULO
dspace.entity.typePublication
ubb.EstadoPUBLICADA
ubb.Otra ReparticionDEPARTAMENTO DE INGENIERIA ELECTRICA Y ELECTRONICA
ubb.SedeCONCEPCIÓN
Archivos
Colecciones
Artículos científicos