Publicación: CHARACTERIZATION OF AMORPHOUS PT/ZNO FILMS GROWN ON SILICON(100) SUBSTRATES BY A PHOTOCHEMICAL METAL ORGANIC DEPOSITION AND THEIR POTENTIAL USE AS GAS SENSORS
Fecha
2013
Título de la revista
ISSN de la revista
Título del volumen
Editor
POLYHEDRON
Resumen
PURE AND 10% PT-LOADED ZINC OXIDE THIN FILMS HAVE BEEN SUCCESSFULLY PREPARED BY DIRECT UV IRRADIATION OF BIS(?-DIKETONATE)ZINC(II) AND PT(II) PRECURSOR COMPLEXES SPIN-COATED ON SI(1 0 0) SUBSTRATES. THE SURFACE MORPHOLOGY OF THE FILMS WAS CHARACTERIZED USING ATOMIC FORCE MICROSCOPY (AFM) AND IT SHOWED THAT THE AS-PHOTODEPOSITED FILMS ARE AMORPHOUS AND HAVE A ROUGHER SURFACE THAN THERMALLY TREATED FILMS. THE CHEMICAL COMPOSITION OF THE FILMS WAS DETERMINED BY X-RAY PHOTOELECTRON SPECTROSCOPY (XPS). THE RESULTS INDICATED THE PRESENCE OF ZNO AND PTO ON THE SURFACE OF AS-DEPOSITED LOADED ZINC OXIDE FILMS. GAS SENSING TESTS REVEAL THAT AS-DEPOSITED 10% PT/ZNO FILMS EXHIBIT A BETTER RESPONSE THAN PURE ZNO FILMS TOWARDS 20 PPM CARBON MONOXIDE AT AN OPERATING TEMPERATURE OF 250 °C. THE SENSORS ALSO HAVE FAST RESPONSE AND RECOVERY CHARACTERISTICS.
Descripción
Palabras clave
ZINC OXIDE, THIN FILMS, PHOTOELECTRON SPECTROSCOPY, PHOTOCHEMICAL DEPOSITION, CARBON MONOXIDE SENSOR
